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Our Senior Application Engineer, Jeff Dobson will be attending NDT Aerospace 2019. The 3 day event will take place in Paris-Saclay, with over 200 participants expected to attend and over 100 technical presentations. Jeff will be presenting on improving ultrasonic inspection of tapered CFRP structure using cloud based FEA simulation. With the event just over a week away, we thought it would be the perfect time to share with you an interview with Jeff and our Director of Engineering, Cyprien Rusu discussing Non-Destructive Testing.
Last week OnScale were silver sponsors at IEEE IUS 2019 in Glasgow. The event was extremely successful, and we were delighted that so many event attendees were attracted to our booth. We’d like to thank everyone who stopped by booth #14 to speak with us!
We are very excited to announce the expansion of our Glasgow Office, following a £450,000 Regional Selective Assistance (RSA) grant from Scottish Enterprise.
Thank you to everyone who was able to attend our Optimizing MEMS R&D with OnScale workshop in Boston. The workshop covered the capabilities and technology of the OnScale approach to semiconductor, MEMS, transducers, and sensors simulation. We also discussed the future of engineering simulation and how OnScale helps engineers to increase productivity and reduce time and cost.
In this blog post we discuss the key solver capabilities that OnScale provides to RF engineers designing acoustic filters. We describe the process of simulating different resonators based on surface acoustic wave (SAW) and bulk acoustic wave (BAW) technology.
We are excited to announce that we will be hosting an OnScale workshop in Burlington, Massachusetts on August 27th! Join to learn about the capabilities and technology of the OnScale approach to semiconductor, MEMS, transducers, and sensors simulation. Hear from world-class experts about the future of engineering simulation and how to overcome its challenges. Experience hands-on how OnScale’s software can enhance your workflow reducing the need for physical prototypes and achieving more design wins.
Sensors are all around us. There are a dozen or so in your smartphone, and dozens more in your laptop, tablet, TV remote control and drone. There are perhaps hundreds in your car, thousands on commercial aircraft and reusable rockets, that will one day take us to the moon, mars, and beyond...
OnScale is happy to announce a newly released Electromagnetic (EM) solver capability, now available on the OnScale Cloud platform. In this blog post we describe the new Electromagnetic (EM) solver in OnScale, designed specifically for next generation antenna array optimization, photonic waveguides, radar for ADAS systems, and many other use cases. Watch full webinar here! Optical waveguide examples and results
The integration of OnScale within BeamTool 9 gives users the capability to quickly and easily simulate their inspection set up and visualize the complete inspection performance. The plug in capabilities include full FEA solvers, mode conversion, defect scattering and the ability to run 1,000s of parallel simulations. As well as enabling improved inspection designs, the use of simulation in the Non Destructive Testing (NDT) process allows BeamTool users to save time and money. New exotic materials and complex components require advancements in NDT, thus simulation is key to design, evaluate and optimize new inspection setups quickly. What is BeamTool?